2. Biology Dictionary
  3. Atomic Force Microscopy

Atomic Force Microscopy原子力显微镜

释义：

The atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The AFM was invented by Binnig, Quate and Gerber in 1986, and is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale.The term 'microscope' in the name is actually a misnomer because it implies looking, while in fact the information is gathered by feeling out the surface with a mechanical feeler.

原子力显微镜 (AFM) 是一种非常高分辨率的扫描探针显微镜，具有纳米分数的分辨率，比光学衍射极限高出超过 1000 倍。AFM 由 Binnig、Quate 和 Gerber 于 1986 年发明，是成像、测量和操作纳米尺度物质的主要工具之一。名字中的“显微镜”其实是一个误称，因为它暗示是通过观察来获取信息，而实际上信息是通过机械触觉感知表面来收集的。

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